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Characterization of surface topography by confocal microscopy: I. Principles and the measurement system

✍ Scribed by Udupa, Ganesha; Singaperumal, M; Sirohi, R S; Kothiyal, M P


Book ID
120394771
Publisher
Institute of Physics
Year
2000
Tongue
English
Weight
225 KB
Volume
11
Category
Article
ISSN
0957-0233

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