✦ LIBER ✦
Characterization of surface roughness of Pt Schottky contacts on quaternary n-Al0.08In0.08Ga0.84N thin film assessed by atomic force microscopy and fractal analysis
✍ Scribed by Ţălu, Ştefan; Ghazai, Alaa J.; Stach, Sebastian; Hassan, Abu; Hassan, Zainuriah; Ţălu, Mihai
- Book ID
- 121580447
- Publisher
- Springer US
- Year
- 2013
- Tongue
- English
- Weight
- 941 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0957-4522
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