✦ LIBER ✦
Characterization of surface layer in Si/MgO·Al2O3/SiO2/Si by ultra-violet reflection spectroscopy
✍ Scribed by K. Egami; M. Mikami; M. Kimura; H. Tsuya; T. Hamaguchi
- Publisher
- Elsevier Science
- Year
- 1985
- Tongue
- English
- Weight
- 323 KB
- Volume
- 71
- Category
- Article
- ISSN
- 0022-0248
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