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Characterization of SOS-CMOS FETs at Low Temperatures for the Design of Integrated Circuits for Quantum Bit Control and Readout

✍ Scribed by Ekanayake, S.R.; Lehmann, T.; Dzurak, A.S.; Clark, R.G.; Brawley, A.


Book ID
114619893
Publisher
IEEE
Year
2010
Tongue
English
Weight
399 KB
Volume
57
Category
Article
ISSN
0018-9383

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