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Characterization of soft ferromagnetic materials by inductance spectroscopy and magnetoimpedance

✍ Scribed by R. Valenzuela; H. Montiel; M.P. Gutiérrez; I. Betancourt

Book ID
113723872
Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
149 KB
Volume
294
Category
Article
ISSN
0304-8853

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## Abstract Comparative structural analyses of a crystallized, 60 nm thick silicon film deposited on quartz substrate were performed using high resolution transmission electron microscopy (HRTEM) and Raman spectroscopy (RS). Both methods suggest high degree of crystallization of the film. The mater