Characterization of SiO using fine features of X-ray K emission spectra : W. L. Baun, J. S. Solomon. Vacuum21, No. 5 (1971), p. 165

• Publisher: Elsevier Science
• Year: 1972
• Tongue: English
• Weight: 105 KB
• Volume: 11
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(72)90779-2