✦ LIBER ✦
Characterization of single-sided gate-to-drain non-overlapped implantation nMOSFETs for multi-functional non-volatile memory applications
✍ Scribed by E.S. Jeng; Y.F. Chen; C.C. Chang; K.M. Peng; S.W. Chou; C.W. Ho; C.F. Huang; J. Gong
- Book ID
- 113916075
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 786 KB
- Volume
- 68
- Category
- Article
- ISSN
- 0038-1101
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