✦ LIBER ✦
Characterization of silicon wafers by transient microwave photo-conductivity measurements : A. Sanders and M. Kunst. Solid-St. Electron.34(9), 1007 (1991)
- Publisher
- Elsevier Science
- Year
- 1992
- Tongue
- English
- Weight
- 134 KB
- Volume
- 32
- Category
- Article
- ISSN
- 0026-2714
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