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Characterization of silicon nanowire by use of full-vectorial finite element method

โœ Scribed by Kejalakshmy, N. ;Agrawal, Arti ;Aden, Yasin ;Leung, D. M. H. ;Rahman, B. M. A. ;Grattan, K. T. V.


Book ID
115355157
Publisher
The Optical Society
Year
2010
Tongue
English
Weight
976 KB
Volume
49
Category
Article
ISSN
1559-128X

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