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Characterization of Silicon Dioxide Films on a 4H-SiC Si(0001) Face by Fourier Transform Infrared (FT-IR) Spectroscopy and Cathodoluminescence Spectroscopy
✍ Scribed by Yoshikawa, Masanobu; Seki, Hirohumi; Inoue, Keiko; Matsuda, Keiko; Tanahashi, Yusaku; Sako, Hideki; Nanen, Yuihiro; Kato, Muneharu; Kimoto, Tsunenobu
- Book ID
- 115366580
- Publisher
- Society for Applied Spectroscopy
- Year
- 2011
- Tongue
- English
- Weight
- 250 KB
- Volume
- 65
- Category
- Article
- ISSN
- 0003-7028
- DOI
- 10.1366/10-06186
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