✦ LIBER ✦
Characterization of self-heating effects in semiconductor resistors during transmission line pulses
- Book ID
- 104057805
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 943 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0026-2714
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✦ Synopsis
The purpose of this work is the experimental extraction of the local average temperature occurring in silicon resistors when a transmission line pulse is applied. The local temperature is determined by combining transmission line pulses of different amplitude and at different ambient temperatures with three-dimensional electro-thermal simulation. The obtained calibration curves can be applied to convert the phase shift information as obtained by interferometric techniques (e.g. in Transient Interferometric Mapping) into absolute temperature readings.
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