Characterization of Se implanted layers for GaAs FETS : B. R. Singh, Madhu Kochhar, O. P. Daga and W. S. Khokle. Microelectron. Reliab.23 (5), 857 (1983)

• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 137 KB
• Volume: 24
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(84)90424-4