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Characterization of recast Nafion films by small- and wide-angle X-ray scattering

✍ Scribed by John Halim; Günther G. Scherer; Manfred Stamm


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
290 KB
Volume
195
Category
Article
ISSN
1022-1352

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✦ Synopsis


Abstract

Room temperature recast NafionGeneral formula:

films, prepared under different humidities in the curing atmosphere, were characterized by small‐ and wide‐angle X‐ray scattering (SAXS and WAXS). SAXS reveals that the humidity influences the size of the ionic clusters in these polymer films. It was found that the number and size of ionic clusters increases with increasing relative humidity. WAXS indicates the presence of locally ordered regions of the backbone polymer. These results allow a qualitative understanding of the electrochemical behaviour of Nafion recast films cured at different humidities, as described in the literature.


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