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Characterization of rapid-thermal-annealed InAs/In0.15Ga0.85As dots-in-well heterostructure using double crystal x-ray diffraction and photoluminescence

✍ Scribed by Krishna, S.; Raghavan, S.; Gray, A. L.; Stintz, A.; Malloy, K. J.


Book ID
118163810
Publisher
American Institute of Physics
Year
2002
Tongue
English
Weight
373 KB
Volume
80
Category
Article
ISSN
0003-6951

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