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Characterization of pore size distribution in porous silicon by NMR cryoporosimetry and adsorption methods

✍ Scribed by A. G. Khokhlov; R. R. Valiullin; M. A. Stepovich; J. Kärger

Book ID: 110211047
Publisher: Springer
Year: 2008
Tongue: English
Weight: 308 KB
Volume: 70
Category: Article
ISSN: 1061-933X
DOI: 10.1134/s1061933x08040169

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