Characterization of photolithographically defined NIS tunnel junctions as X-ray sensors

✍ Scribed by D. Chow; B. Neuhauser; M. Frank; C.A. Mears; R. Abusaidi; M. Cunningham; R.M. Golzarian; D.D. Hake; S.E. Labov; M.A. Lindeman; W.E. Owens; B. Sadoulet; A. Slepoy

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 353 KB
• Volume: 370
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(95)01048-3