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Characterization of oxide layers induced by oxygen ion implantation into Ti, V, Cr, Zr, Nb, Mo, Hf, Ta and W

✍ Scribed by Yoshio Okabe; Takanobu Fujihana; Masaya Iwaki; B.V. Crist


Book ID
107930369
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
412 KB
Volume
66
Category
Article
ISSN
0257-8972

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