✦ LIBER ✦
Characterization of one-dimension edge roughness from far-field irradiance at subwavelength-scale precision
✍ Scribed by Shu-Chun Chu; Jyh-Long Chern
- Book ID
- 103873558
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 262 KB
- Volume
- 281
- Category
- Article
- ISSN
- 0030-4018
No coin nor oath required. For personal study only.