Characterization of Ni-Cr thin films by X-ray analysis

X-ray characterization of Au/Ni multilay

X-ray characterization of Au/Ni multilayer thin films

✍ J. Chaudhuri; S.M. Alyan; A.F. Jankowski 📂 Article 📅 1992 🏛 Elsevier Science 🌐 English ⚖ 362 KB

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Principles of X-ray Diffraction

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 678 KB

Diffraction effects are observed when electromagnetic radiation impinges on periodic structures with geometrical variations on the length scale of the wavelength of the radiation. The interatomic distances in crystals and molecules amount to 0.15-0.4 nm which correspond in the electromagnetic spectr

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Index

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 98 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Line Profile Analysis

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 810 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || Residual Stress Analysis

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 696 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t

Thin Film Analysis by X-Ray Scattering (

Thin Film Analysis by X-Ray Scattering (BIRKHOLZ:THIN FILM X-RAY O-BK) || High-Resolution X-ray Diffraction

✍ Birkholz, Mario 📂 Article 📅 2006 🏛 Wiley-VCH Verlag GmbH & Co. KGaA 🌐 German ⚖ 766 KB

With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of t