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Characterization of near-terahertz complementary metal-oxide semiconductor circuits using a Fourier-transform interferometer

✍ Scribed by D. J. Arenas; D. Shim; D. I. Koukis; E. Seok; D. B. Tanner; K. K. O


Book ID
126297106
Publisher
American Institute of Physics
Year
2011
Tongue
English
Weight
896 KB
Volume
82
Category
Article
ISSN
0034-6748

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