Characterization of Nanomagnet Fringing Fields in Hybrid Semiconductor/Ferromagnetic Devices

✍ Scribed by Bae, J.-U.; Lin, T.-Y.; Yoon, Y.; Kim, S.J.; Bird, J.P.; Imre, A.; Porod, W.; Reno, J.L.

• Book ID: 114652609
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 510 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2008.2002924