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Characterization of nano and meso scale deformation structures with intense X-ray synchrotron sources

✍ Scribed by G.E. Ice; R.I. Barabash; F.J. Walker

Publisher: Elsevier Science
Year: 2005
Tongue: English
Weight: 304 KB
Volume: 36
Category: Article
ISSN: 1359-8368
DOI: 10.1016/j.compositesb.2004.10.001

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✦ Synopsis

Advanced polychromatic microdiffraction is sensitive to the organization of dislocations and other defects that rotate the lattice planes. Using ultra-brilliant third-generation synchrotron sources and non-dispersive X-ray focusing optics, it is now possible to analyze individual dislocation cells and walls at a submicron scale that cannot be probed by traditional methods. The method is applied to an Ir weld sample to illustrate how microdiffraction can be used to determine the locally active dislocation system.

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