✦ LIBER ✦
Characterization of multiple deep level systems in semiconductor junctions by admittance measurements : M. Beguwala and C. R. Crowell. Solid St. Electron. 17, 203 (1974)
- Publisher
- Elsevier Science
- Year
- 1974
- Tongue
- English
- Weight
- 113 KB
- Volume
- 13
- Category
- Article
- ISSN
- 0026-2714
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