𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Characterization of multilayers by means of EDXS in the analytical TEM

✍ Scribed by J. Thomas; Reinhold Rennekamp; Ludwig van Loyen

Book ID
105897308
Publisher
Springer
Year
1998
Tongue
English
Weight
187 KB
Volume
361
Category
Article
ISSN
1618-2650

No coin nor oath required. For personal study only.

πŸ“œ SIMILAR VOLUMES

TEM characterization of La/B4C multilaye
TEM characterization of La/B4C multilayer systems by the geometric phase method
✍ HΓ€ussler, D. ;Spiecker, E. ;Yang, S. ;JΓ€ger, W. ;StΓΆrmer, M. ;Bormann, R. ;Zwick πŸ“‚ Article πŸ“… 2005 πŸ› John Wiley and Sons 🌐 English βš– 1008 KB

## Abstract New La/B~4~C multilayer systems with layer thicknesses in the nanometer range have been deposited onto structured silicon (001) surfaces by magnetron sputtering and have been characterized by transmission electron microscopy (TEM). By applying a geometric phase method which has been ori