✦ LIBER ✦
Characterization of mixed-signal properties of MOSFETs with high-k (SiON/HfSiON/TaN) gate stacks
✍ Scribed by Rittersma, Z.M.; Vertregt, M.; Deweerd, W.; van Elshocht, S.; Srinivasan, P.; Simoen, E.
- Book ID
- 114618248
- Publisher
- IEEE
- Year
- 2006
- Tongue
- English
- Weight
- 611 KB
- Volume
- 53
- Category
- Article
- ISSN
- 0018-9383
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