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Characterization of Microfabricated Probes for Combined Atomic Force and High-Resolution Scanning Electrochemical Microscopy

✍ Scribed by Gullo, Maurizio R.; Frederix, Patrick L. T. M.; Akiyama, Terunobu; Engel, Andreas; deRooij, Nico F.; Staufer, Urs

No coin nor oath required. For personal study only.

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