Cd 0.96 Zn 0.04 Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X-ray diffraction techniques are used to determine the thickness, composition a
Characterization of MBE-grown Ga1−xAlxAs alloy films by Raman scattering
✍ Scribed by Hou, Y. T.; Feng, Z. C.; Li, M. F.; Chua, S. J.
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 94 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0142-2421
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✦ Synopsis
Molecular beam epitaxy (MBE)-grown ternary Ga 1-x Al
x As films, with Al composition x ranging from 0 to 1 in steps of 0.1, have been studied by Raman scattering at room temperature and at 80 K. The observed broadening and asymmetry of the first-order longitudinal-optical phonon spectra induced by alloy disorder are simulated using the spatial correlation model. The obtained correlation length for GaAs-like and AlAs-like modes are observed to decrease as the reduction of Ga composition 1 -x and Al composition x , respectively. It is also shown that the correlation length depends sensitively on the composition. No significant temperature or phonon mode dependence is found. A combination with thermodynamic analysis suggests that the random compositional distribution in alloy seems to be the dominant contribution to this disorder effect.
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