Characterization of Local Dielectric Properties of Superconductor<tex>$rm YBa_2rm Cu_3rm O_7-delta$</tex>Using Evanescent Microwave Microscopy

✍ Scribed by Kleismit, R.A.; Kozlowski, G.; Biggers, R.; Maartense, I.; Kazimierczuk, M.K.; Mast, D.B.

• Book ID: 125533578
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 459 KB
• Volume: 15
• Category: Article
• ISSN: 1051-8223
• DOI: 10.1109/TASC.2005.848633