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Characterization of liquid-phase epitaxially grown HgCdTe films by magnetoresistance measurements

โœ Scribed by J. S. Kim; D. G. Seiler; L. Colombo; M. C. Chen


Book ID
112812666
Publisher
Springer US
Year
1995
Tongue
English
Weight
647 KB
Volume
24
Category
Article
ISSN
0361-5235

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