✦ LIBER ✦
Characterization of lateral correlation length of interface roughness in MBE grown GaAs/AlAs quantum wells by mobility measurement
✍ Scribed by T. Noda; M. Tanaka; H. Sakaki
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 409 KB
- Volume
- 111
- Category
- Article
- ISSN
- 0022-0248
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