We report on the optical planar waveguide formation and modal characterization in Nd:LuVO 4 crystals by triple-energy O 3+ -ion implantation at energies of 2.4, 3.0, and 3.6 MeV and doses of 1.4, 1.4, and 3.1 ร 10 14 ions/cm 2 , respectively. The prism-coupling method is used to investigate the dark
Characterization of laser waveguides in Nd:CNGG crystals formed by low fluence carbon ion implantation
โ Scribed by Liang-Ling Wang; Yong-Gui Yu
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 614 KB
- Volume
- 256
- Category
- Article
- ISSN
- 0169-4332
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โฆ Synopsis
We report on Nd:CNGG active planar waveguides produced by 6.0 MeV carbon ion implantation at fluence from 1 ร 10 14 ions/cm 2 to 8 ร 10 14 ions/cm 2 . The refractive index profiles, which were reconstructed according to the measured dark mode spectroscopy, showed that the refractive indices had negative changes in the surface region, forming typical barrier waveguide. The width of waveguide structure induced by carbon ion implantation is $3.8 mm. The typical barrier-shaped distribution may be mainly due to the nuclear energy deposition of the incident ions into the substrate. By performing a modal analysis on the observed TE modes, it was found that the TE 0 and TE 1 modes can be well-confined inside the waveguide.
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