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Characterization of laser-irradiated surfaces of a polycrystalline diamond film with an atomic force microscope

✍ Scribed by Bögli, U.; Blatter, A.; Bächli, A.; Lüthi, R.; Meyer, E.

Book ID
122618665
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
796 KB
Volume
2
Category
Article
ISSN
0925-9635

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## Abstract The influence of the voltage applied to the tip of an atomic force microscope (AFM) on the local modification of the surface of CVD‐grown diamond films is studied. By applying a negative voltage to the conductive (highly doped) silicon AFM tip, two kinds of patterns can be created. In t