Characterization of Laser-Arc deposited multilayer systems by means of AES, Factor Analysis and XPS

✍ Scribed by A. John; Hans-Joachim Scheibe; Holger Ziegele; Steffen Oswald

• Publisher: Springer
• Year: 1997
• Tongue: English
• Weight: 90 KB
• Volume: 358
• Category: Article
• ISSN: 1618-2650
• DOI: 10.1007/s002160050413