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Characterization of InxGa1−xAsInP epilayers by X-ray double crystal rocking curve peak profile analysis

✍ Scribed by Haiyan An; Ming Li; Shuren Yang; Zhenhong Mai; Shiyong Liu


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
236 KB
Volume
148
Category
Article
ISSN
0022-0248

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