Characterization of interfacial properties in magnetic tunnel junctions by bias-dependent complex impedance spectroscopy

✍ Scribed by Hsu, C.Y.; Huang, J.C.A.

• Book ID: 114650310
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 132 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9464
• DOI: 10.1109/tmag.2005.854712