Characterization of interface states in thin films of thermally grown SiO2: F. Campabadal, X. Aymerich-Humet and F. Ferra-Mestres. Vacuum34 (10/11), 1005 (1984)

• Publisher: Elsevier Science
• Year: 1985
• Tongue: English
• Weight: 135 KB
• Volume: 25
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(85)90313-0