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Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as base electrode

✍ Scribed by J. Vaniš; D. H. Chow; J. Pangrác; F. Šroubek; T. C. McGill; J. Walachová


Book ID
104556384
Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
200 KB
Volume
0
Category
Article
ISSN
1862-6351

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