✦ LIBER ✦
Characterization of high temperature annealing of InP by scanning photoluminescence and capacitance-voltage measurements of metal/insulator/semiconductor devices
✍ Scribed by J. Tardy; J.L. Perrossier; F. Krafft; S.K. Krawczyk; I. Thomas; D. Barbier
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 1018 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0921-5107
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