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Characterization of HgCdTe Diodes on Si Substrates Using Temperature-Dependent Current-Voltage Measurements and Deep Level Transient Spectroscopy

✍ Scribed by D. Johnstone; T.D. Golding; R. Hellmer; J.H. Dinan; M. Carmody


Book ID
107453854
Publisher
Springer US
Year
2007
Tongue
English
Weight
249 KB
Volume
36
Category
Article
ISSN
0361-5235

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