Characterization of heterogeneous SiO2 materials by scanning electron microscope and micro fluorescence XAS techniques

✍ Scribed by L. Khouchaf; F. Boinski; M.H. Tuilier; A.M. Flank

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 1000 KB
• Volume: 252
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.07.030