Characterization of heteroepitaxial silicon on sapphire by UV reffectometry : M. T. Duffy, G. W. Cullen, R. A. Soltis, G. Harbeke and J. R. Sandercock. RCA Rev.46 19 (March 1985)

• Book ID: 103280687
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 130 KB
• Volume: 26
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(86)90176-9