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Characterization of generation lifetime and deep-level defects in an In0.4Ga0.6Asp−i−n photodiode prepared by molecular beam epitaxy growth on GaAs

✍ Scribed by Yen C. Tzeng; Ping C. Yang; Ching S. Lee; Sheng S. Li


Book ID
111709164
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
258 KB
Volume
35
Category
Article
ISSN
0038-1101

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