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Characterization of GaN based Schottky UV detectors in the vacuum UV (VUV) and the soft X-ray (SX) region (10–100 nm)

✍ Scribed by Motogaito, Atsushi ;Watanabe, Hironobu ;Hiramatsu, Kazumasa ;Fukui, Kazutoshi ;Hamamura, Yutaka ;Tadatomo, Kazuyuki


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
65 KB
Volume
200
Category
Article
ISSN
0031-8965

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