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Characterization of GaAs/AlAs interfacial atomic step structures on a (411)A-oriented substrate by transmission electron microscope

โœ Scribed by Y. Tsuda; S. Shimomura; S. Hiyamizu; N. Sano


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
524 KB
Volume
150
Category
Article
ISSN
0022-0248

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