Characterization of GaAs FET's in Terms of Noise, Gain, and Scattering Parameters through a Noise Parameter Test Set

✍ Scribed by Calandra, E.F.; Martines, G.; Sannino, M.

• Book ID: 114658419
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 794 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9480
• DOI: 10.1109/tmtt.1984.1132658