✦ LIBER ✦
Characterization of energy levels related to impurities in epitaxial 4H-SiC ion implanted p+n junctions
✍ Scribed by Menichelli, David; Scaringella, Monica; Moscatelli, Francesco; Bruzzi, Mara; Nipoti, Roberta
- Book ID
- 123182644
- Publisher
- Elsevier Science
- Year
- 2007
- Tongue
- English
- Weight
- 253 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0925-9635
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