Characterization of electronic structure and defect states of thin epitaxial BiFeO[sub 3] films by UV-visible absorption and cathodoluminescence spectroscopies

✍ Scribed by Hauser, A. J.; Zhang, J.; Mier, L.; Ricciardo, R. A.; Woodward, P. M.; Gustafson, T. L.; Brillson, L. J.; Yang, F. Y.

• Book ID: 121242399
• Publisher: American Institute of Physics
• Year: 2008
• Tongue: English
• Weight: 541 KB
• Volume: 92
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.2939101