✦ LIBER ✦
Characterization of Edge Fringing Effect on the – Responses From Depletion to Deep Depletion of MOS(p) Capacitors With Ultrathin Oxide and High- Dielectric
✍ Scribed by Jen-Yuan Cheng; Jenn-Gwo Hwu
- Book ID
- 114620833
- Publisher
- IEEE
- Year
- 2012
- Tongue
- English
- Weight
- 879 KB
- Volume
- 59
- Category
- Article
- ISSN
- 0018-9383
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