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Characterization of Doped Silicon from 0.1 to 2.5 THz Using Multiple Reflection

✍ Scribed by Jeon, Tae-In

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Optical and electronic properties of dop

✍ van Exter, Martin; Grischkowsky, D. 📂 Article 📅 1990 🏛 American Institute of Physics 🌐 English ⚖ 549 KB

[AIP National renewable energy laborator

✍ Shafarman, W. N.; Birkmire, R. W.; Marudachalam, M.; McCandless, B. E.; Schultz, 📂 Article 📅 1997 🏛 AIP ⚖ 969 KB