✦ LIBER ✦
Characterization of Distribution of Trap States in Silicon-on-Insulator Layers by Front-Gate Characteristics in n-Channel SOI MOSFETs
✍ Scribed by Kajiwara, K.; Nakajima, Y.; Hanajiri, T.; Toyabe, T.; Sugano, T.
- Book ID
- 114619442
- Publisher
- IEEE
- Year
- 2008
- Tongue
- English
- Weight
- 444 KB
- Volume
- 55
- Category
- Article
- ISSN
- 0018-9383
No coin nor oath required. For personal study only.